APA Style
Musa, John D., Iannino, Anthony, Okumoto, Kazuhira. (1987).
Software reliability measurement, prediction, application .
New York:
McGraw-Hill.
Chicago Style
Musa, John D., Iannino, Anthony, Okumoto, Kazuhira.
Software reliability measurement, prediction, application.
New York:
McGraw-Hill,
1987.
Text.
MLA Style
Musa, John D., Iannino, Anthony, Okumoto, Kazuhira.
Software reliability measurement, prediction, application.
New York:
McGraw-Hill,
1987.
Text.
Turabian Style
Musa, John D., Iannino, Anthony, Okumoto, Kazuhira.
Software reliability measurement, prediction, application.
New York:
McGraw-Hill,
1987.
Print.